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Proceedings Paper

Slow motion of domain walls in amorphous TbFe films
Author(s): T. G. Pokhil; B. S. Vvedensky; E. N. Nikolaev
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Paper Abstract

In r ec en t year s the amor phous r ar e ear th --t r an si t I on met al ( RE-TM) films have been extensively studied. A combination of structural, mag neti: and magnetooptical properties stimulate their application as media for reversal thermomagnetic recording. Of certain interest ic the investigation of physical properties of the films determining the processes of thermomaçjnetic writing and signal degradation. Investigation of the process of film remagnetiz4ticn is one of the tasks in this direction. It is known that the domain nucleation and th dorain wall moticn appear to be the major mechanisms of remagneti- zation process in thin RE--TM amorphous films'5 It has been shown th&: hcn the external magnetic field value is ncar the coercive force of the film, the magnetic aftereffect is observed, 6)? Since most of th RE-TM films exibit a characteristic feature that the remagnetiza- tion process proceeds due to the domain wall motion from relatively sn311 mourit of nuclei , the magnetic aftereffect was related with a slow domain wall motions The domain wall motion was considered as the thro:tivated process with the temperature dependence of the proba- bility 9 of Arrenius type8)9

Paper Details

Date Published: 1 August 1990
PDF: 11 pages
Proc. SPIE 1274, Electro-Optic and Magneto-Optic Materials II, (1 August 1990); doi: 10.1117/12.20507
Show Author Affiliations
T. G. Pokhil, Institute of Chemical Physics (Russia)
B. S. Vvedensky, Institute of Chemical Physics (Russia)
E. N. Nikolaev, Institute of Chemical Physics (Russia)


Published in SPIE Proceedings Vol. 1274:
Electro-Optic and Magneto-Optic Materials II
Hans Dammann, Editor(s)

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