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Proceedings Paper

High-performance hyperspectral imaging using virtual slit optics
Author(s): Bradford B. Behr; Yusuf Bismilla; Andrew T. Cenko; Brandon DesRoches; Jeffrey T. Meade; Elizabeth A. Munro; Jared Slaa; Arsen R. Hajian
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Paper Abstract

Tornado Spectral Systems (TSS) has developed High Throughput Virtual Slit (HTVS) technology that improves the performance of spectrometers by factors of several while maintaining system size. In the simplest configuration, the HTVS allows optical designers to remove the lossy slit from a spectrometer, greatly increasing throughput without a loss of resolution. This is especially useful in many standoff applications, where every photon matters. TSS has tested multiple configurations of HTVS spectral sensing and spectral imaging technology, including standoff sensing, point scan imaging, long-slit pushbroom imaging and similar configurations. The HTVS throughput-resolution advantage allows us to increase scanning speed, decrease system size, decrease aperture, decrease source intensity requirements or some combination of all four. HTVS technology expands the realm of viable spectral imaging applications. We discuss the applicability of this technology to spectral imaging and standoff sensing and present experimental results from several prototype and production spectrometers.

Paper Details

Date Published: 21 May 2014
PDF: 8 pages
Proc. SPIE 9101, Next-Generation Spectroscopic Technologies VII, 91010X (21 May 2014); doi: 10.1117/12.2050571
Show Author Affiliations
Bradford B. Behr, Tornado Spectral Systems (United States)
Yusuf Bismilla, Tornado Spectral Systems (Canada)
Andrew T. Cenko, Tornado Spectral Systems (Canada)
Brandon DesRoches, Tornado Spectral Systems (Canada)
Jeffrey T. Meade, Tornado Spectral Systems (Canada)
Elizabeth A. Munro, Tornado Spectral Systems (Canada)
Jared Slaa, Tornado Spectral Systems (Canada)
Arsen R. Hajian, Tornado Spectral Systems (Canada)

Published in SPIE Proceedings Vol. 9101:
Next-Generation Spectroscopic Technologies VII
Mark A. Druy; Richard A. Crocombe, Editor(s)

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