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Proceedings Paper

A novel two-pattern full lateral resolution structured light illumination method
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Paper Abstract

Structured Light Illumination is a widely used 3D shape measurement technique in non-contact surface scanning. Multi-pattern based Structured Light Illumination methods are the most accurate measuring techniques, but are sensitive to object motion during the pattern projection. To reduce this sensitivity, Composite Pattern was introduced as a single pattern Structured Light Illumination technique. Composite Pattern technique spatially modulates several Phase Measuring Profilometry patterns into a single pattern but demonstrated sensitivity to surface contrast and an object’s Spatial Modulation Transfer Function in the form of banding error. The Modified Composite Pattern was developed based on Composite Pattern, but used an imbedded binary gray code to minimize sensitivity to an object’s Spatial Modulation Transfer Function and banding at the expense of lateral resolution. We present a novel method utilizing an MCP pattern for non-ambiguous phase followed by a single sinusoidal pattern. The surface phase modulates the single sinusoidal pattern which is demodulated using a quadrature demodulation technique and then unwrapped by the MCP phase result. A single sinusoidal pattern reconstruction inherently has banding error. So the final step is to use an existing de-banding algorithm. The mathematical implementation is given in detail for the two pattern algorithm and experimental results are presented.

Paper Details

Date Published: 5 May 2014
PDF: 12 pages
Proc. SPIE 9094, Optical Pattern Recognition XXV, 90940H (5 May 2014); doi: 10.1117/12.2050520
Show Author Affiliations
Minghao Wang, Univ. of Kentucky (United States)
Laurence Hassebrook, Univ. of Kentucky (United States)


Published in SPIE Proceedings Vol. 9094:
Optical Pattern Recognition XXV
David Casasent; Tien-Hsin Chao, Editor(s)

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