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Proceedings Paper

Singularities in the interference field of the three beam interferometer
Author(s): Piotr Kurzynowski; Marzena Zdunek
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Paper Abstract

Different types of singularities in the interference field of three plane waves with different polarization states are presented. As a result various types of singularities were found: isolated zero intensity points and polarization singularities of different types (depending on a chosen set of polarization parameters). The isolated zero intensity points form a specific rectangular lattice which turns into a hexagonal one when using the analyzer; an additional isolated zero intensity points appear as a result of interaction of the polarization singularities with the analyzer. The vortices observed in the phase pattern have topological signs equal to ± 1. More interesting are the polarization singularities present in the interference field without the analyzer. We observed the polarization singularities with different topological charges, −2 and + 1, for azimuth angle distribution and 0 for the diagonal angle distribution in the interference field of the three linearly polarized waves (LLL). In the case of the two linearly polarized waves interference and a third one circularly polarized (LLC) the polarization singularities with charge 0 were observed in the azimuth, ellipticity and diagonal angles distributions. We also noticed other characteristic points: saddles (for the ellipticity angle distribution in the LLL interference) and cross edge dislocations (for the phase angle distributions in both cases). Moreover, the zero intensity points in the setup without the analyzer appeared to be double singularities where both polarization parameters are undetermined simultaneously.

Paper Details

Date Published: 17 December 2013
PDF: 6 pages
Proc. SPIE 9066, Eleventh International Conference on Correlation Optics, 90660L (17 December 2013); doi: 10.1117/12.2050243
Show Author Affiliations
Piotr Kurzynowski, Wrocław Univ. of Technology (Poland)
Marzena Zdunek, Wrocław Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 9066:
Eleventh International Conference on Correlation Optics
Oleg Vyacheslavovich Angelsky, Editor(s)

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