Share Email Print

Proceedings Paper

Multiple-order staircase etalon spectroscopy
Author(s): M. K. Yetzbacher; C. W. Miller; A. J. Boudreau; M. Christophersen; M. J. Deprenger
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Traditional Fabry-Perot (FP) spectroscopy is bandwidth limited to avoid mixing signals from different transmission orders of the interferometer. Unlike Fourier transformation, the extraction of spectra from multiple-order interferograms resulting from multiplexed optical signals is in general an ill-posed problem. Using a Fourier transform approach, we derive a generalized Nyquist limit appropriate to signal recovery from FP interferograms. This result is used to derive a set of design rules giving the usable wavelength range and spectral resolution of FP interferometers or etalon arrays given a set of accessible physical parameters. Numerical simulations verify the utility of these design rules for moderate resolution spectroscopy with bandwidths limited by the detector spectral response. Stable and accurate spectral recovery over more than one octave is accomplished by simple matrix multiplication of the interferogram. In analogy to recently developed single-order micro-etalon arrays (Proc. of SPIE v.8266, no. 82660Q), we introduce Multiple-Order Staircase Etalon Spectroscopy (MOSES), in which micro-arrays of multiple order etalons can be bonded to or co-fabricated with a sensor array. MOSES enables broader bandwidth multispectral and hyperspectral instruments than single-order etalon arrays while keeping a physical footprint insignificantly different from that of the detection array.

Paper Details

Date Published: 21 May 2014
PDF: 11 pages
Proc. SPIE 9101, Next-Generation Spectroscopic Technologies VII, 910104 (21 May 2014); doi: 10.1117/12.2049848
Show Author Affiliations
M. K. Yetzbacher, U.S. Naval Research Lab. (United States)
C. W. Miller, U.S. Naval Research Lab. (United States)
A. J. Boudreau, U.S. Naval Research Lab. (United States)
M. Christophersen, U.S. Naval Research Lab. (United States)
M. J. Deprenger, Tekla Research Inc. (United States)

Published in SPIE Proceedings Vol. 9101:
Next-Generation Spectroscopic Technologies VII
Mark A. Druy; Richard A. Crocombe, Editor(s)

© SPIE. Terms of Use
Back to Top