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Proceedings Paper

A defects detection system for the surfaces of stampings
Author(s): Baowen Chen; Jun Jiang; Jun Cheng; Sanming Shen
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Paper Abstract

Detecting defects on the surfaces of stampings plays a critical role in the manufacturing process. Many methods have been proposed to detect and identify simple defects on stampings. However, these methods suffer from large system size, high cost, and low speed for inspection. This paper proposes a new visual system for detecting defects on the surfaces of stampings. A set of LED bar lights are used to illuminate the stamping surface from the four sides. This can ensure that the irradiation directions are parallel to the surface. Thus, it can enhance the imaging of the defects and punching edges in the vertical orientation of the surface, which facilitates the location of the defects such as scratch and pitting and the measurement of the punching sizes. Thereby, the defects can be classified using simple shape and dimension analysis. The proposed system is a part of the automated sorting system. Practical operations verify the effectiveness of the proposed system.

Paper Details

Date Published: 24 December 2013
PDF: 5 pages
Proc. SPIE 9067, Sixth International Conference on Machine Vision (ICMV 2013), 906708 (24 December 2013); doi: 10.1117/12.2049795
Show Author Affiliations
Baowen Chen, Shenzhen Institute of Information Technology (China)
Jun Jiang, Shenzhen Institute of Advanced Technology (China)
The Chinese Univ. of Hong Kong (China)
The Shenzhen Key Lab. of Computer Vision and Pattern Recognition (China)
Jun Cheng, Shenzhen Institute of Advanced Technology (China)
The Chinese Univ. of Hong Kong (China)
Guangdong Provincial Key Lab. of Robotics and Intelligent System (China)
Sanming Shen, Shenzhen Institutes of Advanced Technology (China)
The Chinese Univ. of Hong Kong (China)


Published in SPIE Proceedings Vol. 9067:
Sixth International Conference on Machine Vision (ICMV 2013)
Branislav Vuksanovic; Antanas Verikas; Jianhong Zhou, Editor(s)

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