Share Email Print
cover

Proceedings Paper

Study of junction performance in mid-wavelength HgCdTe photodiodes by laser-beam-induced current microscope
Author(s): Weicheng Qiu; X. A. Cheng; Rui Wang; Fei Yin; Bo Zhang; Weida Hu; Xiaoshuang Chen; Wei Lu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper reports on the disappearance of photosensitive area extension effect and the novel temperature dependence of junction performance for mid-wavelength HgCdTe detectors. The performances of junction under different temperatures are characterized by laser beam induced current (LBIC) microscope. The physical mechanism of temperature dependence on junction transformation is elaborated and demonstrated using numerical simulations. It is found that Hg-interstitial diffusion and temperature activated defects jointly lead to the p-n junction transformation depended on temperature, and wider band gap compared with the long-wavelength HgCdTe photodiode may correlate with the disappearance of photosensitive area extension effect.

Paper Details

Date Published: 24 June 2014
PDF: 5 pages
Proc. SPIE 9070, Infrared Technology and Applications XL, 907030 (24 June 2014); doi: 10.1117/12.2049395
Show Author Affiliations
Weicheng Qiu, Shanghai Institute of Technical Physics (China)
National Univ. of Defense Technology (China)
X. A. Cheng, National Univ. of Defense Technology (China)
Rui Wang, National Univ. of Defense Technology (China)
Fei Yin, Shanghai Institute of Technical Physics (China)
Bo Zhang, Shanghai Institute of Technical Physics (China)
Weida Hu, Shanghai Institute of Technical Physics (China)
Xiaoshuang Chen, Shanghai Institute of Technical Physics (China)
Wei Lu, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 9070:
Infrared Technology and Applications XL
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)

© SPIE. Terms of Use
Back to Top