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Proceedings Paper

A 33-mpixel 120-fps CMOS image sensor using 0.11-μm CIS process
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Paper Abstract

We have been researching and developing a CMOS image sensor that has 2.8 μm x 2.8 μm pixel, 33-Mpixel resolution (7680 horizontal pixels x 4320 vertical pixels), 120-fps frame rate, and 12-bit analog-to-digital converter for “8K Super Hi-Vision.” In order to improve its sensitivity, we used a 0.11-μm nanofabricated process and attempted to increase the conversion gain from an electron charge to a voltage in the pixel. The prototyped image sensor shows a sensitivity of 2.4 V/lx•s, which is 1.6 times higher than that of a conventional image sensor. This image sensor also realized the input-referred random noise as low as 2.1 e-rms.

Paper Details

Date Published: 21 May 2014
PDF: 7 pages
Proc. SPIE 9100, Image Sensing Technologies: Materials, Devices, Systems, and Applications, 910005 (21 May 2014); doi: 10.1117/12.2049145
Show Author Affiliations
Toshio Yasue, NHK Japan Broadcasting Corp. (Japan)
Tetsuya Hayashida, NHK Japan Broadcasting Corp. (Japan)
Jun Yonai, NHK Japan Broadcasting Corp. (Japan)
Kazuya Kitamura, NHK Japan Broadcasting Corp. (Japan)
Shizuoka Univ. (Japan)
Toshihisa Watabe, NHK Engineering System, Inc. (Japan)
Shizuoka Univ. (Japan)
Hiroshi Ootake, NHK Japan Broadcasting Corp. (Japan)
Hiroshi Shimamoto, NHK Japan Broadcasting Corp. (Japan)
Tomohiko Kosugi, Brookman Technology, Inc. (Japan)
Takashi Watanabe, Brookman Technology, Inc. (Japan)
Satoshi Aoyama, Brookman Technology, Inc. (Japan)
Shoji Kawahito, Shizuoka Univ. (Japan)
Brookman Technology, Inc. (Japan)


Published in SPIE Proceedings Vol. 9100:
Image Sensing Technologies: Materials, Devices, Systems, and Applications
Nibir K. Dhar; Achyut K. Dutta, Editor(s)

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