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Proceedings Paper

CCD or CMOS camera calibration using point spread function
Author(s): D. G. Abdelsalam; M. Stanislas; S. Coudert
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Paper Abstract

We present a simple method based on the acquisition of a back-illuminated pinhole to estimate the point spread function (PSF) for CCD (or CMOS) sensor characterization. This method is used to measure the variations in sensitivity of the 2D-sensor array systems. The experimental results show that there is a variation in sensitivity for each position on the CCD of the calibrated camera and the pixel optical center error with respect to the geometrical center is in the range of 1/10th of a pixel. We claim that the pixel error comes most probably from the coherence of the laser light used, or eventually from possible defects in shape, surface quality, optical performance of micro-lenses, and the uniformity of the parameters across the wafer. This may have significant consequences for coherent light imaging using CCD (or CMOS) such as Particle Image Velocimetry.

Paper Details

Date Published: 2 June 2014
PDF: 4 pages
Proc. SPIE 9234, International Conference on Experimental Mechanics 2013 and Twelfth Asian Conference on Experimental Mechanics, 92340Z (2 June 2014); doi: 10.1117/12.2048991
Show Author Affiliations
D. G. Abdelsalam, Lab. de Mécanique, Ecole Centrale de Lille, Univ. Lille Nord de France (France)
National Institute of Standards (Egypt)
M. Stanislas, Lab. de Mécanique, Ecole Centrale de Lille, Univ. Lille Nord de France (France)
S. Coudert, Lab. de Mécanique, CNRS, Univ. Lille Nord de France (France)


Published in SPIE Proceedings Vol. 9234:
International Conference on Experimental Mechanics 2013 and Twelfth Asian Conference on Experimental Mechanics
Somnuk Sirisoonthorn, Editor(s)

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