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Proceedings Paper

Development of portable 3D optical measuring system using structured light projection method
Author(s): Hiroshi Aoki
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Paper Abstract

Three-dimensional (3D) scanners are becoming increasingly common in many industries. However most of these scanning technologies have drawbacks for practical use due to size, weight, accessibility, and ease-of-use. Depending on the application, speed, flexibility and portability can often be deemed more important than accuracy. We have developed a solution to address this market requirement and overcome the aforementioned limitations. To counteract shortcomings such as heavy weight and large size, an optical sensor is used that consists of a laser projector, a camera system, and a multi-touch screen. Structured laser light is projected onto the measured object with a newly designed laser projector employing a single Micro Electro Mechanical Systems (MEMS) mirror. The optical system is optimized for the combination of a Laser Diode (LD), the MEMS mirror and the size of measurement area to secure the ideal contrast of structured light. Also, we developed a new calibration algorithm for this sensor with MEMS laser projector that uses an optical camera model for point cloud calculation. These technical advancements make the sensor compact, save power consumption, and reduce heat generation yet still allows for rapid calculation. Due to the principle of the measurement, structured light triangulation utilizing phase-shifting technology, resolution is improved. To meet requirements for practical applications, the optics, electronics, image processing, display and data management capabilities have been integrated into a single compact unit.

Paper Details

Date Published: 28 May 2014
PDF: 8 pages
Proc. SPIE 9110, Dimensional Optical Metrology and Inspection for Practical Applications III, 91100Q (28 May 2014); doi: 10.1117/12.2048896
Show Author Affiliations
Hiroshi Aoki, Nikon Corp. (Japan)

Published in SPIE Proceedings Vol. 9110:
Dimensional Optical Metrology and Inspection for Practical Applications III
Kevin G. Harding; Toru Yoshizawa, Editor(s)

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