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Proceedings Paper

Microwave-source time-resolved infrared radiometry for monitoring of curing and deposition processes
Author(s): Robert Osiander; Jane W. Maclachlan Spicer; John C. Murphy
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Paper Abstract

Thermal wave methods employing optical heating sources have been used successfully in the past to determine layer thicknesses or thermal diffusivities. However, monitoring of curing or deposition processes can be difficult with such techniques due to changes in the sample surface properties such as optical absorption during processing. The method introduced in this paper, microwave-source time-resolved infrared radiometry (TRIR) in conjunction with intentionally embedded carbon or metal fibers allows the determination of surface layer thickness and thermal diffusivity almost independently of the surface properties of the layer. This suggests the use of fibers as embedded sensors in applications where layer thickness or thermal properties need to be controlled during processing.

Paper Details

Date Published: 28 March 1995
PDF: 11 pages
Proc. SPIE 2473, Thermosense XVII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (28 March 1995); doi: 10.1117/12.204855
Show Author Affiliations
Robert Osiander, Johns Hopkins Univ. (United States)
Jane W. Maclachlan Spicer, Johns Hopkins Univ. (United States)
John C. Murphy, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 2473:
Thermosense XVII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
Sharon A. Semanovich, Editor(s)

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