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Proceedings Paper

Spectral purity enhancement for the EUV lithography systems by suppressing UV reflection from multilayers
Author(s): Qiushi Huang; Meint de Boer; Jonathan Barreaux; Daniel Mathijs Paardekooper; Toine van den Boogaard; Robbert van de Kruijs; Erwin Zoethout; Eric Louis; Fred Bijkerk
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Paper Abstract

Plasma based radiation sources optimized to emit 13.5 nm Extreme UV radiation also produce a significant amount of light at longer wavelengths. This so called out-of-band (OoB) radiation is detrimental for the imaging capabilities of an EUV lithographic imaging system, particularly the ultraviolet (UV) parts of the light (λ=100-400 nm). To suppress these wavelengths while maintaining the high efficiency of the mirror for EUV light, several methods have been developed, including phase-shift gratings (PsG) and anti-reflection layers (SPE layer). Both methods have achieved a suppression factor of 10 - 30 around the target wavelength. To achieve a full band suppression effect with a minimum loss of EUV light, a new scheme based on surface pyramid structures was developed. An average suppression of more than 10 times was achieved with a relative EUV efficiency of 82.2% by using the Si pyramids structure (compared to a flat multilayer (ML)). Recently, we have successfully produced a pyramid structure consisting of multilayers which greatly improves the relative EUV efficiency to 94.2%.

Paper Details

Date Published: 17 April 2014
PDF: 5 pages
Proc. SPIE 9048, Extreme Ultraviolet (EUV) Lithography V, 90480G (17 April 2014); doi: 10.1117/12.2046415
Show Author Affiliations
Qiushi Huang, FOM Institute DIFFER (Netherlands)
Univ. of Twente (Netherlands)
Meint de Boer, Univ. of Twente (Netherlands)
Jonathan Barreaux, Univ. of Twente (Netherlands)
Daniel Mathijs Paardekooper, Univ. of Leiden (Netherlands)
Toine van den Boogaard, FOM Institute DIFFER (Netherlands)
Robbert van de Kruijs, FOM Institute DIFFER (Netherlands)
Univ. of Twente (Netherlands)
Erwin Zoethout, FOM Institute DIFFER (Netherlands)
Eric Louis, FOM Institute DIFFER (Netherlands)
Univ. of Twente (Netherlands)
Fred Bijkerk, FOM Institute DIFFER (Netherlands)
Univ. of Twente (Netherlands)

Published in SPIE Proceedings Vol. 9048:
Extreme Ultraviolet (EUV) Lithography V
Obert R. Wood; Eric M. Panning, Editor(s)

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