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Proceedings Paper

Compressive strain measurement using RFID patch antenna sensors
Author(s): Chunhee Cho; Xiaohua Yi; Yang Wang; Manos M. Tentzeris; Roberto T. Leon
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Paper Abstract

In this research, two radiofrequency identification (RFID) antenna sensor designs are tested for compressive strain measurement. The first design is a passive (battery-free) folded patch antenna sensor with a planar dimension of 61mm × 69mm. The second design is a slotted patch antenna sensor, whose dimension is reduced to 48mm × 44mm by introducing slots on antenna conducting layer to detour surface current path. A three-point bending setup is fabricated to apply compression on a tapered aluminum specimen mounted with an antenna sensor. Mechanics-electromagnetics coupled simulation shows that the antenna resonance frequency shifts when each antenna sensor is under compressive strain. Extensive compression tests are conducted to verify the strain sensing performance of the two sensors. Experimental results confirm that the resonance frequency of each antenna sensor increases in an approximately linear relationship with respect to compressive strain. The compressive strain sensing performance of the two RFID antenna sensors, including strain sensitivity and determination coefficient, is evaluated based on the experimental data.

Paper Details

Date Published: 10 April 2014
PDF: 11 pages
Proc. SPIE 9061, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2014, 90610X (10 April 2014); doi: 10.1117/12.2045122
Show Author Affiliations
Chunhee Cho, Georgia Institute of Technology (United States)
Xiaohua Yi, Georgia Institute of Technology (United States)
Yang Wang, Georgia Institute of Technology (United States)
Manos M. Tentzeris, Georgia Institute of Technology (United States)
Roberto T. Leon, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 9061:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2014
Jerome P. Lynch; Kon-Well Wang; Hoon Sohn, Editor(s)

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