Share Email Print
cover

Proceedings Paper

Nonlinear forced response of piezoelectric microcantilevers with application to tapping mode atomic force microscopy
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Atomic Force Microscopy (AFM) uses a scanning process performed by a microcantilever beam to create a three dimensional image of a nano-scale physical surface. AFM includes a microcantilever probe with a tip at the end that is controlled in order to keep the force between the tip and the surface constant by changing the distance of the microcantilever from the surface. Some microcantilevers have a layer of piezoelectric material on one side of the microcantilever for actuation purpose. An accurate understanding of the microcantilever motion and tip-sample force is needed to generate accurate imaging. In this paper, the equations of motion for an AFM piezoelectric microcantilever probe are derived for a nonlinear contact force. The analytical expressions for natural frequencies and mode shapes are determined. Then, the analytical frequency response of the piezoelectric probe is found using the method of multiple scales. The effects of nonlinear excitation force on the microcantilever probe’s frequency and amplitude have been analytically studied. The force nonlinearities lead to a frequency shift in the response. Accurately modeling this frequency shift during contact mode of the AFM probe is a significant consideration for the generation of more accurate imaging.

Paper Details

Date Published: 9 March 2014
PDF: 13 pages
Proc. SPIE 9057, Active and Passive Smart Structures and Integrated Systems 2014, 905722 (9 March 2014); doi: 10.1117/12.2044481
Show Author Affiliations
Rachael McCarty, The Univ. of Alabama (United States)
S. Nima Mahmoodi, The Univ. of Alabama (United States)


Published in SPIE Proceedings Vol. 9057:
Active and Passive Smart Structures and Integrated Systems 2014
Wei-Hsin Liao, Editor(s)

© SPIE. Terms of Use
Back to Top