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Proceedings Paper

Stain defect detection for mobile phone camera modules
Author(s): Sehee Hong; Chulhee Lee
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Paper Abstract

In this paper, we present a stain defect detection algorithm based on the difference of window mean brightness. In particular, we use the maximum square value of the difference brightness in divided windows (MAXWDMS). Window shapes generally affect WDMS values and make stain images clearly distinguishable. The proposed method consists of three steps: window design, stain localization using MAXWDMS and setting the WDMS level. The proposed methodology has been successfully used in stain defect detection, achieving good detection rates in both quantitative evaluation and sensibility estimation. Experimental results show improved detection accuracy and a satisfactory processing time.

Paper Details

Date Published: 7 March 2014
PDF: 9 pages
Proc. SPIE 9024, Image Processing: Machine Vision Applications VII, 902403 (7 March 2014); doi: 10.1117/12.2043223
Show Author Affiliations
Sehee Hong, Yonsei Univ. (Korea, Republic of)
Chulhee Lee, Yonsei Univ. (Korea, Republic of)

Published in SPIE Proceedings Vol. 9024:
Image Processing: Machine Vision Applications VII
Kurt S. Niel; Philip R. Bingham, Editor(s)

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