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Proceedings Paper

Step-height measurement with a low coherence interferometer using continuous wavelet transform
Author(s): Zhang Jian; Takamasa Suzuki; Samuel Choi; Osami Sasaki
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Paper Abstract

With the development of electronic technology in recent years, electronic components become increasingly miniaturized. At the same time a more accurate measurement method becomes indispensable. In the current measurement of nano-level, the Michelson interferometer with the laser diode is widely used, the method can measure the object accurately without touching the object. However it can't measure the step height that is larger than the half-wavelength. In this study, we improve the conventional Michelson interferometer by using a super luminescent diode and continuous wavelet transform, which can detect the time that maximizes the amplitude of the interference signal. We can accurately measure the surface-position of the object with this time. The method used in this experiment measured the step height of 20 microns.

Paper Details

Date Published: 19 December 2013
PDF: 7 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461I (19 December 2013); doi: 10.1117/12.2042640
Show Author Affiliations
Zhang Jian, Niigata Univ. (Japan)
Takamasa Suzuki, Niigata Univ. (Japan)
Samuel Choi, Niigata Univ. (Japan)
Osami Sasaki, Niigata Univ. (Japan)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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