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Proceedings Paper

Joint estimation of high resolution images and depth maps from light field cameras
Author(s): Kazuki Ohashi; Keita Takahashi; Toshiaki Fujii
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Paper Abstract

Light field cameras are attracting much attention as tools for acquiring 3D information of a scene through a single camera. The main drawback of typical lenselet-based light field cameras is the limited resolution. This limitation comes from the structure where a microlens array is inserted between the sensor and the main lens. The microlens array projects 4D light field on a single 2D image sensor at the sacrifice of the resolution; the angular resolution and the position resolution trade-off under the fixed resolution of the image sensor. This fundamental trade-off remains after the raw light field image is converted to a set of sub-aperture images. The purpose of our study is to estimate a higher resolution image from low resolution sub-aperture images using a framework of super-resolution reconstruction. In this reconstruction, these sub-aperture images should be registered as accurately as possible. This registration is equivalent to depth estimation. Therefore, we propose a method where super-resolution and depth refinement are performed alternatively. Most of the process of our method is implemented by image processing operations. We present several experimental results using a Lytro camera, where we increased the resolution of a sub-aperture image by three times horizontally and vertically. Our method can produce clearer images compared to the original sub-aperture images and the case without depth refinement.

Paper Details

Date Published: 6 March 2014
PDF: 7 pages
Proc. SPIE 9011, Stereoscopic Displays and Applications XXV, 90111B (6 March 2014); doi: 10.1117/12.2042627
Show Author Affiliations
Kazuki Ohashi, Nagoya Univ. (Japan)
Keita Takahashi, Nagoya Univ. (Japan)
Toshiaki Fujii, Nagoya Univ. (Japan)

Published in SPIE Proceedings Vol. 9011:
Stereoscopic Displays and Applications XXV
Andrew J. Woods; Nicolas S. Holliman; Gregg E. Favalora, Editor(s)

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