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Proceedings Paper

Machine vision based quality inspection of flat glass products
Author(s): G. Zauner; M. Schagerl
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Paper Abstract

This application paper presents a machine vision solution for the quality inspection of flat glass products. A contact image sensor (CIS) is used to generate digital images of the glass surfaces. The presented machine vision based quality inspection at the end of the production line aims to classify five different glass defect types. The defect images are usually characterized by very little ‘image structure’, i.e. homogeneous regions without distinct image texture. Additionally, these defect images usually consist of only a few pixels. At the same time the appearance of certain defect classes can be very diverse (e.g. water drops). We used simple state-of-the-art image features like histogram-based features (std. deviation, curtosis, skewness), geometric features (form factor/elongation, eccentricity, Hu-moments) and texture features (grey level run length matrix, co-occurrence matrix) to extract defect information. The main contribution of this work now lies in the systematic evaluation of various machine learning algorithms to identify appropriate classification approaches for this specific class of images. In this way, the following machine learning algorithms were compared: decision tree (J48), random forest, JRip rules, naive Bayes, Support Vector Machine (multi class), neural network (multilayer perceptron) and k-Nearest Neighbour. We used a representative image database of 2300 defect images and applied cross validation for evaluation purposes.

Paper Details

Date Published: 7 March 2014
PDF: 9 pages
Proc. SPIE 9024, Image Processing: Machine Vision Applications VII, 902402 (7 March 2014); doi: 10.1117/12.2042520
Show Author Affiliations
G. Zauner, Univ. of Applied Sciences Upper Austria (Austria)
M. Schagerl, Univ. of Applied Sciences Upper Austria (Austria)


Published in SPIE Proceedings Vol. 9024:
Image Processing: Machine Vision Applications VII
Kurt S. Niel; Philip R. Bingham, Editor(s)

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