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Proceedings Paper

Pinhole array implementation of star test polarimetry
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Paper Abstract

Star Test Polarimetry is a method of inferring polarization information in a single irradiance measurement from the shape of a point spread function [1]. We present the optical design of an image sampling polarimeter that utilizes a stress engineered optical element to image the polarization states of scattered light collected by a lens across a given field. In our scheme, an intermediate image is sampled by a pinhole array and a relay system projects the polarization dependent point spread functions to a CCD. In this way, we show polarization mapping of a sample using a single irradiance image.

Paper Details

Date Published: 12 March 2014
PDF: 10 pages
Proc. SPIE 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 894912 (12 March 2014); doi: 10.1117/12.2042093
Show Author Affiliations
Brandon G. Zimmerman, Univ. of Rochester (United States)
Roshita Ramkhalawon, Univ. of Rochester (United States)
Miguel Alonso, Univ. of Rochester (United States)
Thomas G. Brown, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 8949:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

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