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Proceedings Paper

Decay pattern matching analysis for multi-label FLIM
Author(s): Benedikt Kraemer; Thomas Niehoerster; Anna Loeschberger; Felix Koberling; Matthias Patting; Markus Sauer; Rainer Erdmann
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Paper Details

Date Published:
Proc. SPIE 8948, Multiphoton Microscopy in the Biomedical Sciences XIV, 89481F; doi: 10.1117/12.2042066
Show Author Affiliations
Benedikt Kraemer, PicoQuant GmbH (Germany)
Thomas Niehoerster, Julius-Maximilians-Univ. Würzburg (Germany)
Anna Loeschberger, Julius-Maximilians-Univ. Würzburg (Germany)
Felix Koberling, PicoQuant GmbH (Germany)
Matthias Patting, PicoQuant GmbH (Germany)
Markus Sauer, Julius-Maximilians-Univ. Würzburg (Germany)
Rainer Erdmann, PicoQuant GmbH (Germany)

Published in SPIE Proceedings Vol. 8948:
Multiphoton Microscopy in the Biomedical Sciences XIV
Ammasi Periasamy; Peter T. C. So; Karsten König, Editor(s)

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