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Proceedings Paper

Narrowband continuous-wave terahertz generation and imaging
Author(s): Brian Dolasinski; Peter Powers
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Paper Abstract

The output of seeded, dual periodically poled lithium niobate (PPLN) optical parametric generators (OPG) are combined in the nonlinear crystal 4-dimthylamino-N-methyl-4-stilbazolium-tosylate (DAST) to produce a widely tunable narrowband THz source via difference frequency generation (DFG). We have demonstrated that by employing this type of configuration we are able to tune our system seamlessly, without mode-hops, from 1.5 THz to 21THz with a minimum bandwidth of 3.1 GHz. The bandwidth of the source was measured by using the THz transmission spectrum of water vapor lines over a 3-meter path length. By selecting of the DFG pump wavelength to be at 1380 nm and the signal wavelength to tune over a range from 1380 nm to 1570 nm, we produced several maxima in the output THz spectrum that was dependent on the phase matching ability of the DAST crystal and the efficiency of our pyro-electric detector. Due to the effects of dispersive phase matching, filter absorption of the THz waves, and two-photon absorption multiple band gaps in the overall spectrum occur and are discussed. Employing the dual generator scheme, we have obtained THz images at several locations in the spectrum using an infrared camera that runs at a rate of 35 frames per second. We have demonstrated the ability to image 13 THz to 20 THz under static conditions. We will present images of carbon fibers illuminated at different THz frequencies.

Paper Details

Date Published: 7 March 2014
PDF: 9 pages
Proc. SPIE 8985, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VII, 898504 (7 March 2014); doi: 10.1117/12.2041949
Show Author Affiliations
Brian Dolasinski, Univ. of Dayton (United States)
Peter Powers, Univ. of Dayton (United States)


Published in SPIE Proceedings Vol. 8985:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VII
Laurence P. Sadwick; Créidhe M. O'Sullivan, Editor(s)

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