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Proceedings Paper

Measurement of thermal lensing in GaAs induced by 100 W Tm:fiber laser
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Paper Abstract

We present the characterization of thermal distortion induced in bulk and orientation-patterned GaAs samples by a 100 W narrow linewidth, linearly polarized CW Tm:fiber laser focused to ~150 μm diameter. For a 500-μm thick bulk GaAs sample, the induced thermal distortion is measured using a probe laser beam at 1080 nm and a Shack-Hartmann wavefront sensor (SHWS). We also compare the power dependent induced divergence for 500-μm thick bulk GaAs and 10-mm thick orientation-partnered GaAs (OP-GaAs) samples as they are translated axially through the focus of a 2-μm wavelength Tm:fiber laser beam.

Paper Details

Date Published: 20 February 2014
PDF: 6 pages
Proc. SPIE 8964, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications XIII, 896419 (20 February 2014); doi: 10.1117/12.2041323
Show Author Affiliations
Joshua Bradford, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Konstantin Vodopyanov, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Peter Schunemann, BAE Systems (United States)
Lawrence Shah, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Martin Richardson, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 8964:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications XIII
Konstantin L. Vodopyanov, Editor(s)

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