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Proceedings Paper

Characterization of relief printing
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Paper Abstract

Relief printing technology developed by Océ allows the superposition of several layers of colorant on different types of media which creates a variation of the surface height defined by the input to the printer. Evaluating the reproduction accuracy of distinct surface characteristics is of great importance to the application of the relief printing system. Therefore, it is necessary to develop quality metrics to evaluate the relief process. In this paper, we focus on the third dimension of relief printing, i.e. height information. To achieve this goal, we define metrics and develop models that aim to evaluate relief prints in two aspects: overall fidelity and surface finish. To characterize the overall fidelity, three metrics are calculated: Modulation Transfer Function (MTF), difference and root-mean-squared error (RMSE) between the input height map and scanned height map, and print surface angle accuracy. For the surface finish property, we measure the surface roughness, generate surface normal maps and develop a light reflection model that serves as a simulation of the differences between ideal prints and real prints that may be perceived by human observers. Three sets of test targets are designed and printed by the Océ relief printer prototypes for the calculation of the above metrics: (i) twisted target, (ii) sinusoidal wave target, and (iii) ramp target. The results provide quantitative evaluations of the printing quality in the third dimension, and demonstrate that the height of relief prints is reproduced accurately with respect to the input design. The factors that affect the printing quality include: printing direction, frequency and amplitude of the input signal, shape of relief prints. Besides the above factors, there are two additional aspects that influence the viewing experience of relief prints: lighting condition and viewing angle.

Paper Details

Date Published: 10 March 2014
PDF: 14 pages
Proc. SPIE 9018, Measuring, Modeling, and Reproducing Material Appearance, 90180P (10 March 2014); doi: 10.1117/12.2040977
Show Author Affiliations
Xing Liu, Purdue Univ. (United States)
Lin Chen, Rochester Institute of Technology (United States)
Maria-Valezzka Ortiz-Segovia, Océ Print Logic Technologies (France)
James Ferwerda, Rochester Institute of Technology (United States)
Jan Allebach, Purdue Univ. (United States)


Published in SPIE Proceedings Vol. 9018:
Measuring, Modeling, and Reproducing Material Appearance
Maria V. Ortiz Segovia; Philipp Urban; Jan P. Allebach, Editor(s)

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