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Proceedings Paper

Fluorescence quenching metrology of graphene
Author(s): Maziar Ghazinejad; Hamed Hosseini Bay; Jennifer Reiber Kyle; Mihrimah Ozkan; Cengiz S. Ozkan
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Paper Abstract

We investigate the application of fluorescence quenching microscopy (FQM) for visual characterization of graphene quality, number of layers and uniformity over its landscape. The method relies on the fact that pristine, modified and multi-layer graphene regions quench fluorescence with different rates. Steady-state and time-resolved emission spectroscopy are used to comparatively characterize the photophysical behavior of pristine graphene relative to unquenched dye on bare substrate. The results demonstrate that with premeditated choice of Fluorescence dye, the interaction between fluorophores and graphene provides valuable tools for identifying the chemical structure and thickness of graphene. Fluorescence quenching metrology can be implemented as the basis for a microscopy based metrology for 2D materials.

Paper Details

Date Published: 19 February 2014
PDF: 7 pages
Proc. SPIE 8994, Photonic and Phononic Properties of Engineered Nanostructures IV, 89941R (19 February 2014); doi: 10.1117/12.2040801
Show Author Affiliations
Maziar Ghazinejad, California State Univ., Fresno (United States)
Hamed Hosseini Bay, Univ. of California, Riverside (United States)
Jennifer Reiber Kyle, Univ. of California, Riverside (United States)
Mihrimah Ozkan, Univ. of California, Riverside (United States)
Cengiz S. Ozkan, Univ. of California, Riverside (United States)


Published in SPIE Proceedings Vol. 8994:
Photonic and Phononic Properties of Engineered Nanostructures IV
Ali Adibi; Shawn-Yu Lin; Axel Scherer, Editor(s)

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