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Proceedings Paper

Understanding the formation of self-organized micro/nanostructures on metal surfaces from femtosecond laser ablation using stop-motion SEM imaging
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Paper Abstract

There are a growing number of unique self-organized micro/nanostructures created using femtosecond laser surface processing that have been demonstrated. Although researchers have provided insight into the formation processes for distinctive morphologies on specific materials, there is a need for a broader understanding of the physics behind the formation of a wide range of morphologies and what parameters affect their formation. In this work, the formation processes for mound structures on 316 stainless steel (SS) with growth above the original sample surface are studied. The formation process for the structures on 316 SS is compared to similar structures formed on nickel using the same technique. The structures are formed using 800 nm, 50 fs laser pulses, and are self-organized, meaning the structure dimensions are much smaller than the spot size of the pulses used to create them. The formation dynamics were studied using a stop-motion scanning electron microscope (SEM) technique, where the same location of an irradiated sample was imaged in the SEM at various pulse counts. The result is a series of images showing the developmental progress with increasing pulse counts. The structures form through a combination of fluid flow of the surface melt that results after irradiation, preferential ablation of the center of the pits between structures, and material/nanoparticle redeposition.

Paper Details

Date Published: 6 March 2014
PDF: 7 pages
Proc. SPIE 8968, Laser-based Micro- and Nanoprocessing VIII, 89680C (6 March 2014); doi: 10.1117/12.2040348
Show Author Affiliations
Craig A. Zuhlke, Univ. of Nebraska-Lincoln (United States)
Troy P. Anderson, Univ. of Nebraska-Lincoln (United States)
Dennis R. Alexander, Univ. of Nebraska-Lincoln (United States)


Published in SPIE Proceedings Vol. 8968:
Laser-based Micro- and Nanoprocessing VIII
Udo Klotzbach; Kunihiko Washio; Craig B. Arnold, Editor(s)

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