Share Email Print
cover

Proceedings Paper

Selective plane illumination microscopy with structured illumination based on spatial light modulators
Author(s): Runze Li; Xing Zhou; Di Wu; Tong Peng; Yanlong Yang; Ming Lei; Xianhua Yu; Baoli Yao; Tong Ye
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Structured-illumination microscopy (SIM) is an efficacious tool to decrease the contribution of the out-of-focus light to images of specimens. However, in SIM, the frequency of the spatial modulation applied to specimens should be adjustable according to the optical properties of the specimens to reach the optimal contrasts. Hence, a common theme in SIM is how the flexibility and quality of modulations at different frequencies can be improved. Digital scanned laser light-sheet microscopy with structured illumination (DSLM-SI) has been the most flexible means for generating modulation and optical sectioning. The complexity of synchronization between the temporal modulation and the beam scanning makes it hard to use and less stable; it also takes more time to acquire images for one plane than selective plane illumination microscopy (SPIM). In this report, we present a recent effort to use a spatial light modulator (SLM) to provide spatial modulation in SPIM. With the SLM, both of the frequency and phase of lateral modulation can be changed rapidly; moreover, this SLM-based SPIM can achieve fast imaging without mechanical moving parts.

Paper Details

Date Published: 12 March 2014
PDF: 5 pages
Proc. SPIE 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 89491S (12 March 2014); doi: 10.1117/12.2040319
Show Author Affiliations
Runze Li, Xi'an Institute of Optics and Precision Mechanics (China)
Xing Zhou, Xi'an Institute of Optics and Precision Mechanics (China)
Di Wu, Xi'an Institute of Optics and Precision Mechanics (China)
Tong Peng, Xi'an Institute of Optics and Precision Mechanics (China)
Yanlong Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Ming Lei, Xi'an Institute of Optics and Precision Mechanics (China)
Xianhua Yu, Xi'an Institute of Optics and Precision Mechanics (China)
Baoli Yao, Xi'an Institute of Optics and Precision Mechanics (China)
Tong Ye, Clemson Univ. (United States)


Published in SPIE Proceedings Vol. 8949:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

© SPIE. Terms of Use
Back to Top