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Proceedings Paper

Point-spread function-based characterization of optical systems
Author(s): Y. G. Soskind; R. P. Walvick; C. D. Giranda; D. N. Laslo; R. Gifford
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Paper Abstract

The response of an optical systems to a point source, known as the point-spread function (PSF), represents one of the most fundamental characteristics of an optical system. The PSF varies as a function of source spectral composition as well as position with respect to the optical axis. PSF characterization of optical systems can be used to predict their performance in imaging and non-imaging applications. In this paper we describe an electro-optical setup for automated characterization of the PSF of optical systems over a broad range of operating conditions and radiance levels, with spectral compositions ranging from ultraviolet (UV) to long-wave infrared (LWIR). Our test setup includes interchangeable radiance sources and computer controlled motion stages which allows for automated characterization of the optical system under test. The software-controlled characterization process provides quantitative analysis of the system’s chromatic and monochromatic aberrations, including axial chromatism, field curvature, and field distortion. The developed process also defines system level characteristics, such as relative illumination, field of regard and magnification. Finally, we demonstrate characterization of the operational dynamic range of imaging and non-imaging sensors employing the described setup, including their threshold responsivity, as well as their saturation performance under intense illumination conditions.

Paper Details

Date Published: 8 March 2014
PDF: 9 pages
Proc. SPIE 8992, Photonic Instrumentation Engineering, 89920E (8 March 2014); doi: 10.1117/12.2040217
Show Author Affiliations
Y. G. Soskind, DHPC Technologies, Inc. (United States)
R. P. Walvick, DHPC Technologies, Inc. (United States)
C. D. Giranda, DHPC Technologies, Inc. (United States)
D. N. Laslo, DHPC Technologies, Inc. (United States)
R. Gifford, DHPC Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 8992:
Photonic Instrumentation Engineering
Yakov G. Soskind; Craig Olson, Editor(s)

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