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Proceedings Paper

The evolution of angled MMI structure on the SOI platform
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Paper Abstract

The angled multimode interferometer (AMMI) was recently demonstrated as a wavelength division (de)multiplexing (WDM) structure employing the phenomenon of dispersive self-imaging in a multimode planar waveguide. It has distinct advantages including very low insertion loss, ease of fabrication and good tolerance to fabrication error. Here, we first demonstrated a further optimized single 4-channel AMMI on the silicon-on-insulator (SOI) platform with a low insertion loss of < 1 dB, a low cross talk of < -23 dB and a non-uniformity of < 0.5 dB. However, a single AMMI is limited to have small channel count with a relatively large channel spacing in order to maintain high-performance WDM functionality. Therefore we subsequently demonstrated two structures derived from a single AMMI on the SOI platform: An 8-channel WDM comprising of two 4-channel AMMIs interleaved by an imbalanced Mach-Zehnder interferometers (MZIs) was fabricated. Low-insertion-loss and low-cross-talk operation was achieved without active tuning structures.

Paper Details

Date Published: 8 March 2014
PDF: 6 pages
Proc. SPIE 8990, Silicon Photonics IX, 89900E (8 March 2014); doi: 10.1117/12.2039577
Show Author Affiliations
Y. Hu, Univ. of Southampton (United Kingdom)
D. J. Thomson, Univ. of Southampton (United Kingdom)
F. Y. Gardes, Univ. of Southampton (United Kingdom)
G. Z. Mashanovich, Univ. of Southampton (United Kingdom)
G. T. Reed, Univ. of Southampton (United Kingdom)


Published in SPIE Proceedings Vol. 8990:
Silicon Photonics IX
Joel Kubby; Graham T. Reed, Editor(s)

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