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Proceedings Paper

Viewports for vacuum applications: correlation between viewport thickness and stress induced birefringence
Author(s): André Becker; J. Weber; M. Flämmich; U. Bergner
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Paper Abstract

The paper gives an introduction into vacuum viewports and its stress introduced birefringence effects. The effect of the stress induced birefringence is measured for viewports of different thicknesses under vacuum conditions. Line scans across the viewports are done to investigate heterogeneity effects also. The variation of thickness is realized with elastomer sealed viewports. In order to compare those results measurements are done also with thermally sealed viewports as well as adhesively sealed viewports.

Paper Details

Date Published: 8 March 2014
PDF: 6 pages
Proc. SPIE 8992, Photonic Instrumentation Engineering, 89920L (8 March 2014); doi: 10.1117/12.2039475
Show Author Affiliations
André Becker, Vakuum Komponenten & Messtechnik GmbH (Germany)
J. Weber, Vakuum Komponenten & Messtechnik GmbH (Germany)
M. Flämmich, Vakuum Komponenten & Messtechnik GmbH (Germany)
U. Bergner, Vakuum Komponenten & Messtechnik GmbH (Germany)

Published in SPIE Proceedings Vol. 8992:
Photonic Instrumentation Engineering
Yakov G. Soskind; Craig Olson, Editor(s)

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