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Proceedings Paper

Erasable diffractive grating couplers in silicon on insulator for wafer scale testing
Author(s): R. Topley; G. Martinez-Jimenez; L. O'Faolain; N. Healy; S. Mailis; D. J. Thomson; F. Y. Gardes; A. C. Peacock; D. N. R. Payne; G. Z. Mashanovich; G. T. Reed
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Paper Abstract

Test points are essential in allowing optical circuits on a wafer to be autonomously tested after selected manufacturing steps, hence allowing poor performance or device failures to be detected early and to be either repaired using direct write methods, or a cessation of further processing to reduce fabrication costs. Grating couplers are a commonly used method for efficiently coupling light from an optical fibre to a silicon waveguide. They are relatively easy to fabricate and they allow light to be coupled into/out from any location on the device without the need for polishing, making them good candidates for an optical test point. A fixed test point can be added for this purpose, although traditionally these grating devices are fabricated by etching the silicon waveguide, and hence this permanently adds loss and leads to a poor performing device when placed into use after testing. We demonstrate a similar device utilising a refractive index change induced by lattice disorder. Raman data collected suggests this lattice damage is reversible, allowing a laser to subsequently erase the grating coupler.

Paper Details

Date Published: 8 March 2014
PDF: 8 pages
Proc. SPIE 8990, Silicon Photonics IX, 899008 (8 March 2014); doi: 10.1117/12.2039179
Show Author Affiliations
R. Topley, Univ. of Southampton (United Kingdom)
G. Martinez-Jimenez, Univ. of Southampton (United Kingdom)
L. O'Faolain, Univ. of St. Andrews (United Kingdom)
N. Healy, Univ. of Southampton (United Kingdom)
S. Mailis, Univ. of Southampton (United Kingdom)
D. J. Thomson, Univ. of Southampton (United Kingdom)
F. Y. Gardes, Univ. of Southampton (United Kingdom)
A. C. Peacock, Univ. of Southampton (United Kingdom)
D. N. R. Payne, Univ. of Southampton (United Kingdom)
G. Z. Mashanovich, Univ. of Southampton (United Kingdom)
G. T. Reed, Univ. of Southampton (United Kingdom)

Published in SPIE Proceedings Vol. 8990:
Silicon Photonics IX
Joel Kubby; Graham T. Reed, Editor(s)

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