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Proceedings Paper

Measuring thicknesses of fast dynamic processes using low-coherence interferometric microscopy
Author(s): Natan T. Shaked
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Proc. SPIE 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 89490T; doi: 10.1117/12.2038972
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Natan T. Shaked, Tel Aviv Univ. (Israel)


Published in SPIE Proceedings Vol. 8949:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

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