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Proceedings Paper

High-color rendering indices performance of glass based phosphor-converted white light-emitting diodes for solid state lighting
Author(s): Chun-Chin Tsai; Wei-Chih Cheng; Guan-Hao Chen; Yu-Chun Lee; Cheng Ta Kuo; Wood-Hi Cheng
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Paper Abstract

The high-temperature operation of glass based phosphor-converted warm-white light-emitting diodes (PC-WWLEDs) is demonstrated. The fabrication and characteristics of low-temperature phosphor (Yollow:Ce:3+:YAG, Greed:Tb3+:YAG, Red:CaAlClSiN3:Eu2+) doped glass applied to high color rendering indices warm-white-light-emitting diodes was presented. In this property is color coordinates (x, y) = (0.32, 0.28), quantum yield (QY) = 55%, color rending index (CRI) =85, correlated color temperature (CCT) =3900K. The result showed the PC-WLEDs maintained good thermal stability at the high temperature operation. The QY decay, CRI attenuation and chromaticity shift in glass and silicone based high-power PC-WLEDs under thermal aging at 150°C and 250°C are also presented and compared. The result indicated that the glass based PC-WLEDs exhibited better thermal stability than the silicone. And the color rendering indices (CRI) glass phosphor may have potential used as a phosphor layer for high-performance and low-cost PCWLEDs used in next-generation indoors solid-state lighting applications.

Paper Details

Date Published: 27 February 2014
PDF: 6 pages
Proc. SPIE 9003, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVIII, 90031K (27 February 2014); doi: 10.1117/12.2038823
Show Author Affiliations
Chun-Chin Tsai, Far East Univ. (Taiwan)
National Sun Yat-Sen Univ. (Taiwan)
Wei-Chih Cheng, National Sun Yat-Sen Univ. (Taiwan)
Guan-Hao Chen, Far East Univ. (China)
Yu-Chun Lee, Lextar Electronics Corp. (Taiwan)
Cheng Ta Kuo, Lextar Electronics Corp. (Taiwan)
Wood-Hi Cheng, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 9003:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVIII
Klaus P. Streubel; Heonsu Jeon; Li-Wei Tu; Martin Strassburg, Editor(s)

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