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Propagation and scattering of vector light beam in turbid scattering medium
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Paper Abstract

Due to its high sensitivity to subtle alterations in medium morphology the vector light beams have recently gained much attention in the area of photonics. This leads to development of a new non-invasive optical technique for tissue diagnostics. Conceptual design of the particular experimental systems requires careful selection of various technical parameters, including beam structure, polarization, coherence, wavelength of incident optical radiation, as well as an estimation of how the spatial and temporal structural alterations in biological tissues can be distinguished by variations of these parameters. Therefore, an accurate realistic description of vector light beams propagation within tissue-like media is required. To simulate and mimic the propagation of vector light beams within the turbid scattering media the stochastic Monte Carlo (MC) technique has been used. In current report we present the developed MC model and the results of simulation of different vector light beams propagation in turbid tissue-like scattering media. The developed MC model takes into account the coherent properties of light, the influence of reflection and refraction at the medium boundary, helicity flip of vortexes and their mutual interference. Finally, similar to the concept of higher order Poincar´e sphere (HOPS), to link the spatial distribution of the intensity of the backscattered vector light beam and its state of polarization on the medium surface we introduced the color-coded HOPS.

Paper Details

Date Published: 17 March 2014
PDF: 10 pages
Proc. SPIE 8940, Optical Biopsy XII, 894006 (17 March 2014); doi: 10.1117/12.2038818
Show Author Affiliations
Alexander Doronin, Univ. of Otago (New Zealand)
Giovanni Milione, The City College of New York (United States)
Igor Meglinski, Univ. of Otago (New Zealand)
Robert R. Alfano, The City College of New York (United States)

Published in SPIE Proceedings Vol. 8940:
Optical Biopsy XII
Robert R. Alfano; Stavros G. Demos, Editor(s)

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