Share Email Print
cover

Proceedings Paper

Vibration criteria for vibration-sensitive laboratory based on intrinsic microseism
Author(s): Chenguang Cai; Biao Zhou; Jingsheng Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Establishment of appropriate vibration criteria is essential for vibration-sensitive laboratories. The vibration criterion curves are commonly used in the evaluation of the ambient vibration. The maximum level of VC-E criterion curve is 3.1μm/s. The intrinsic microseism in the Changping experimental base of National Institute of Metrology has been measured since 2003. The frequency of the intrinsic microseism is about 3.2 Hz, and the velocity magnitude of the intrinsic microseism is about 0.05μm/s, which is much less than the VC-E criterion. The vibration criteria values that are less than the magnitude of the intrinsic microseism cannot be realized, whereas limits that are too broad may result in degradation of the performance of measurement equipment. So the vibration criterions of National Institute of Metrology are established based on the intrinsic microseism and VC curves. Because the VC curves are expressed in the terms of root-mean-square vibration velocity in the band of the one-third octave, it is difficult to identify the vibration interferences from machines such as fans and cooling towers. The vibration criterions of National Institute of Metrology are expressed in terms of both the one-third octave vibration velocity spectrum and velocity average spectrum of the ambient vibration. From the velocity average spectrum, the ambient vibration of vibration-sensitive laboratories can be evaluated and the vibration interferences can be identified by comparison with the intrinsic microseism.

Paper Details

Date Published: 10 October 2013
PDF: 7 pages
Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 891633 (10 October 2013); doi: 10.1117/12.2038335
Show Author Affiliations
Chenguang Cai, National Institute of Metrology (China)
Biao Zhou, National Institute of Metrology (China)
Jingsheng Li, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8916:
Sixth International Symposium on Precision Mechanical Measurements
Shenghua Ye; Yetai Fei, Editor(s)

© SPIE. Terms of Use
Back to Top