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Proceedings Paper

Design of a high-accuracy bi-grating imaging instrument for non-dispersive imaging
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Paper Abstract

Recently, ZWP grating diffraction imaging instrument has been applied in the research and teaching of bi-grating imaging effects by some universities. However, there are problems exposed in the use. The main problem is position location of bi-grating operation which hardly achieves the “Z” shape that is fit for imaging path, especially the diagonal direction deviation of the second grating when it is moving in the platform, which leads to measurement errors for the bi-grating diffraction imaging, and the experiment results are inaccurate. To the grating imaging instrument, the electronic control method has been studied, which is to control moving and rotation of gratings more easily and with high measurement accuracy. The new reform plan of the grating imaging instrument is done and tested, and the experiment results are compared with before reform undone.

Paper Details

Date Published: 19 December 2013
PDF: 6 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461G (19 December 2013); doi: 10.1117/12.2038280
Show Author Affiliations
Weiping Zhang, Guangxi Univ. (China)
Lei Liu, Guangxi Univ. (China)
Shouqiang Sun, Guangxi Univ. (China)
Xianjin Zeng, Guangxi Univ. (China)
Quan Lu, Guangxi Univ. (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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