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Proceedings Paper

Numerical simulation and experimental verification of extended source interferometer
Author(s): Yinlong Hou; Lin Li; Shanshan Wang; Xiao Wang; Haijun Zang; Qiudong Zhu
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Paper Abstract

Extended source interferometer, compared with the classical point source interferometer, can suppress coherent noise of environment and system, decrease dust scattering effects and reduce high-frequency error of reference surface. Numerical simulation and experimental verification of extended source interferometer are discussed in this paper. In order to provide guidance for the experiment, the modeling of the extended source interferometer is realized by using optical design software Zemax. Matlab codes are programmed to rectify the field parameters of the optical system automatically and get a series of interferometric data conveniently. The communication technique of DDE (Dynamic Data Exchange) was used to connect Zemax and Matlab. Then the visibility of interference fringes can be calculated through adding the collected interferometric data. Combined with the simulation, the experimental platform of the extended source interferometer was established, which consists of an extended source, interference cavity and image collection system. The decrease of
high-frequency error of reference surface and coherent noise of the environment is verified. The relation between the spatial coherence and the size, shape, intensity distribution of the extended source is also verified through the analysis of the visibility of interference fringes. The simulation result is in line with the result given by real extended source interferometer. Simulation result shows that the model can simulate the actual optical interference of the extended source interferometer quite well. Therefore, the simulation platform can be used to guide the experiment of interferometer which is based on various extended sources.

Paper Details

Date Published: 19 December 2013
PDF: 9 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904605 (19 December 2013); doi: 10.1117/12.2038097
Show Author Affiliations
Yinlong Hou, Beijing Institute of Technology (China)
Lin Li, Beijing Institute of Technology (China)
Shanshan Wang, Beijing Institute of Technology (China)
Xiao Wang, China North Industries Navigation and Control Technology Research Institute (China)
Haijun Zang, Beijing Institute of Technology (China)
Qiudong Zhu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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