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Proceedings Paper

Defect inspection of quartz crystal based on machine vision
Author(s): Zhebo Chen; Xin Zhang; Dandan Huang
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Paper Abstract

Quartz crystal in oscillator is the basic element in modern electronic technology. The main specification of crystal is frequency, but the surface defect will also affect the stability and working life. At present, the defect inspection of crystal is mostly accomplished with human vision inspection. A new crystal defect inspection method with machine vision is proposed in this paper. The crystal image is acquired with special angle annular dark field illumination. The relationship between the physical feature and the vision feature are discussed. Then, defect inspect algorithm of each kind of defect are designed based those relationship. A large amount of inspection experiments are executed with this algorithm, the results indicate that this method has good practical value because of high efficiencies and high accuracy.

Paper Details

Date Published: 19 December 2013
PDF: 8 pages
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451R (19 December 2013); doi: 10.1117/12.2038090
Show Author Affiliations
Zhebo Chen, Research Institute of Zhejiang Univ. Taizhou (China)
Xin Zhang, Research Institute of Zhejiang Univ. Taizhou (China)
Dandan Huang, Research Institute of Zhejiang Univ. Taizhou (China)


Published in SPIE Proceedings Vol. 9045:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Xinggang Lin; Jesse Zheng, Editor(s)

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