Share Email Print

Proceedings Paper

Spectroscopy-based photonic instrumentation for the manufacturing industry: contactless measurements of distances, temperatures, and chemical composition
Author(s): B. Noharet; E. Zetterlund; O. Tarasenko; M. Lindblom; J. Gurell; A. Bengtson; P. Lundin
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The steady progress in photonic components in terms of cost-to-performance ratio, maturity and robustness opens new avenues for the commercial deployment of photonic sensor systems in a wide range of industrial applications. Advanced sensing can be used to optimize complex processes and thereby enable significant savings in energy consumption. Three cases of robust photonic instrumentation for process optimization and quality control in manufacturing industries are presented: improved metal recycling with laser-induced breakdown spectroscopy, quality control in precision machining by white-light interferometry with optical fiber probes embedded in machining tools, and process optimization in steel foundries by stand-off temperature measurements in blast furnaces with optical fiber lances and spectral analysis techniques. Each of these methods utilizes a low-cost spectrometer, and requires dedicated calibration and signal processing methods to guarantee robust operation in industrial environments with varying conditions. Experimental results are presented, including on-line steel alloy analysis with correct classification rates in excess of 95%, distance measurements with axial resolution of +/- 2nm over a 75μm range, and continuous temperature monitoring of molten steel in oxygen blast furnaces with temperature measurement accuracy better than 1%.

Paper Details

Date Published: 8 March 2014
PDF: 8 pages
Proc. SPIE 8992, Photonic Instrumentation Engineering, 89920R (8 March 2014); doi: 10.1117/12.2037961
Show Author Affiliations
B. Noharet, Acreo Swedish ICT AB (Sweden)
E. Zetterlund, Acreo Swedish ICT AB (Sweden)
O. Tarasenko, Acreo Swedish ICT AB (Sweden)
M. Lindblom, Acreo Swedish ICT AB (Sweden)
J. Gurell, Swerea KIMAB (Sweden)
A. Bengtson, Swerea KIMAB (Sweden)
P. Lundin, Swerea KIMAB (Sweden)

Published in SPIE Proceedings Vol. 8992:
Photonic Instrumentation Engineering
Yakov G. Soskind; Craig Olson, Editor(s)

© SPIE. Terms of Use
Back to Top