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Proceedings Paper

Tasks and organization problems of the optoelectronic metrology laboratory
Author(s): Jan Owsik
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Paper Abstract

The thirty year period of formation of laser technology has resulted in the production of many devices including lasers of various power and energy of cw or pulsed operation, working from the ultraviolet to the far infrared range of the spectrum. Such a rapid development of laser technology forces the necessity of creation of the basis of metrological protection for this technology. Considering a peculiarity of measurements, the parameters and characteristics of laser radiation can be divided into two groups: (1) energy characteristics; (2) spectral/frequency characteristics. The main interest is directed to energy characteristics and that's why a necessity of metrological protection of measurements of laser energy appears.

Paper Details

Date Published: 1 March 1995
PDF: 4 pages
Proc. SPIE 2202, Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing, (1 March 1995); doi: 10.1117/12.203748
Show Author Affiliations
Jan Owsik, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 2202:
Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing
Wieslaw L. Wolinski; Zdzislaw Jankiewicz; Jerzy K. Gajda; Bohdan K. Wolczak, Editor(s)

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