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Proceedings Paper

Modeling of selected metrological properties of laser diodes based on experimental research
Author(s): Danuta Turzenieka; Przemyslaw Otomanski
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Paper Abstract

In this paper the authors present the results of the research that has been carried out hitherto in selected parameters of laser diode. Statistical equation of slotted line processing was defined as well as empirical ratios of the equation, which is useful to analyze metrological properties of the semiconductor laser. The above workings tend to examine the reliability of semiconductor laser processing of current input on optical radiation.

Paper Details

Date Published: 1 March 1995
PDF: 4 pages
Proc. SPIE 2202, Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing, (1 March 1995); doi: 10.1117/12.203747
Show Author Affiliations
Danuta Turzenieka, Poznan Univ. of Technology (Poland)
Przemyslaw Otomanski, Poznan Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 2202:
Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing
Wieslaw L. Wolinski; Zdzislaw Jankiewicz; Jerzy K. Gajda; Bohdan K. Wolczak, Editor(s)

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