Share Email Print
cover

Proceedings Paper

Automatic aberrations compensation for thin object in off-axis digital holographic microscopy
Author(s): Yun Liu; Zhao Wang; Jiansu Li; Junhui Huang; Jianmin Gao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Digital holographic microscopy (DHM) has been widely applied for the topography measurement of microscopic specimen. A total surface fitting method based on Zernike polynomials is presented to remove aberrations in DHM, in which Zernike polynomial coefficients enable to provide quantitative measurement of primary aberrations. The phase free of aberrations is obtained by subtracting out the surface fitting result from the reconstructed phase. The method carries out the total phase aberrations compensation automatically by only one hologram, instead of knowing the physical parameters of optical setup and the aberration mathematical model in advance. The optical system of off-axis DHM is set up and the experiment results are given. Compared with the double-exposure method, the Zernike surface fitting method obtains better phase information owing to removing residual tilt aberration.

Paper Details

Date Published: 31 December 2013
PDF: 7 pages
Proc. SPIE 9042, 2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 904208 (31 December 2013); doi: 10.1117/12.2037457
Show Author Affiliations
Yun Liu, Xi'an Jiaotong Univ. (China)
Xi’an Univ. of Technology (China)
Zhao Wang, Xi'an Jiaotong Univ. (China)
Jiansu Li, Xi'an Jiaotong Univ. (China)
Junhui Huang, Xi'an Jiaotong Univ. (China)
Jianmin Gao, Xi'an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 9042:
2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Xiaocong Yuan; Yunlong Sheng; Kimio Tatsuno, Editor(s)

© SPIE. Terms of Use
Back to Top