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Proceedings Paper

Laser trepanning of CFRP with a scanner head for IR and UV lasers
Author(s): Kenji Anzai; Mitsuaki Aoyama; Akira Fujisaki; Taizo Miyato; Takashi Kayahara; Yoshihisa Harada; Hiroyuki Niino
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Paper Abstract

The dual beam of cw-350 W single-mode near-IR fiber laser and ns-pulsed-35 W UV laser were used in the experiments for cutting. The laser beam on the sample surface was scanned with a galvanometer scanner and focused with the f-theta lens of 400 mm focal length for IR and UV laser irradiations. A prototype remote scanner head for the multiple laser irradiations has been developed for a high-quality and high-speed laser processing of carbon fiber reinforced plastics (CFRP). In this paper, we report on the laser trepanning of circular patterns on CFRP.

Paper Details

Date Published: 6 March 2014
PDF: 6 pages
Proc. SPIE 8967, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XIX, 89670K (6 March 2014); doi: 10.1117/12.2037264
Show Author Affiliations
Kenji Anzai, Advanced Laser and Process Technology Research Association (Japan)
Miyachi Corp. (Japan)
Mitsuaki Aoyama, Advanced Laser and Process Technology Research Association (Japan)
Miyachi Corp. (Japan)
Akira Fujisaki, Advanced Laser and Process Technology Research Association (Japan)
Furukawa Electric Co., Ltd. (Japan)
Taizo Miyato, Advanced Laser and Process Technology Research Association (Japan)
Furukawa Electric Co., Ltd. (Japan)
Takashi Kayahara, Advanced Laser and Process Technology Research Association (Japan)
Furukawa Electric Co., Ltd. (Japan)
Yoshihisa Harada, Advanced Laser and Process Technology Research Association (Japan)
National Institute of Advanced Industrial Science and Technology (Japan)
Hiroyuki Niino, Advanced Laser and Process Technology Research Association (Japan)
National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 8967:
Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XIX
Yoshiki Nakata; Xianfan Xu; Stephan Roth; Beat Neuenschwander, Editor(s)

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