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Proceedings Paper

Optical characterization of low-absorbing thin films in the visible and infrared spectrum
Author(s): Enrico Masetti; Angela M. Piegari; A. Tirabassi
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Paper Abstract

The optical characterization of thin films is a field of continuous investigation, nevertheless there is a lack of data of refractive indexes (n-ik) in the infrared spectrum. In this paper a method for the determination of the optical parameters n and k is described that starting from spectrophotometric measurements gives, by computer, the refractive index profile in a wide wavelength range. Y203, Al203, HfO2, ZnSe and ZnS are the examined film materials and their n and k values in the visible and infrared spectrum (0.35-20 m) are reported.

Paper Details

Date Published: 1 August 1990
PDF: 8 pages
Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); doi: 10.1117/12.20371
Show Author Affiliations
Enrico Masetti, ENEA Thin Film Lab. (Italy)
Angela M. Piegari, ENEA Thin Film Lab. (Italy)
A. Tirabassi, ENEA Thin Film Lab. (Italy)

Published in SPIE Proceedings Vol. 1270:
Optical Thin Films and Applications
Reinhard Herrmann, Editor(s)

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