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Proceedings Paper

Research on modern test system for resolution of white-light sighting telescope
Author(s): Ru-guang Liu; Zuo-jiang Xiao; Zhi-yong An; Pei-pei Wen; Xin-ting Zhang
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Paper Abstract

Resolution is one of the important indexes of examining optical sighting telescope performance. Traditional and subjective test methods generally adopted auxiliary visual instrument reading to achieve resolution test, which was greatly affected by subjective factors, and easy fatigue affected test precision, and it didn’t objectively and quantitatively reflect the resolution of measured sighting telescope. Taking aim at the test requirements, on the basis of overcoming the shortcomings of traditional and subjective test methods, and this paper designed a set of modern test system for resolution of white-light sighting telescope, which employed automatic focusing technology, CCD imaging technology, precision machinery technology, automatic control technology and computer image acquisition technology. Through automatic focusing of zoom lens and man-computer interaction, computer displayed and saved results automatically, which eliminated subjective error of the traditional and subjective test method. The experimental results showed that the test precision of resolution was 0.24″, which achieved the technical specification less than 0.5″, and the test accuracy was ensured.

Paper Details

Date Published: 19 December 2013
PDF: 6 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904610 (19 December 2013); doi: 10.1117/12.2036710
Show Author Affiliations
Ru-guang Liu, Changchun Univ. of Science and Technology (China)
Zuo-jiang Xiao, Changchun Univ. of Science and Technology (China)
Zhi-yong An, Changchun Univ. of Science and Technology (China)
Pei-pei Wen, Changchun Univ. of Science and Technology (China)
Xin-ting Zhang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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