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Proceedings Paper

A nonintrusive method for the measurement of infrared characteristics from engine exhaust plume
Author(s): Xizhong Xiao; Yueming Wang; Bin Miao; Junwei Lang; Shengwei Wang; Xiaoqiong Zhuang; Feng Zhou; Jianyu Wang
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Paper Abstract

Nonintrusive measurements of infrared characteristics from engine exhaust plume are required for emission control or target tracking, due to the advantage of online measurement without affecting the exhaust plume. Conventional nonintrusive measurement techniques, e.g. the passive Fourier-transform infrared (FTIR) absorption spectrometry, lack prior knowledge of backgrounds and consume time to measure the complete infrared characteristics. Hence, an improved but simple nonintrusive method is proposed. Accordingly, a prototype system with a Mid-wave infrared imager has been developed and tested for the measurement of vehicle engine exhaust plume. Subsequently, the time-variant effective transmittance and emissivity is determined. Compared to the passive FTIR absorption spectrometry, this method incorporates a known background into the measurement and is more adequate for recording the rapidly changing exhaust plume radiation. Therefore, the accurate value of the transmittance and emissivity can be obtained. Further analysis reveals that the imager could be replaced with a dispersive spectrometer, which makes it feasible to acquire the absolute transmittance and emissivity with respect to wavelength. Thus, the concentration of specific toxic gases could be calculated following the radiance inversion technique.

Paper Details

Date Published: 19 December 2013
PDF: 8 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460F (19 December 2013); doi: 10.1117/12.2036677
Show Author Affiliations
Xizhong Xiao, Univ. of Chinese Academy of Sciences (China)
Shanghai Institute of Technical Physics (China)
Yueming Wang, Shanghai Institute of Technical Physics (China)
Bin Miao, Shanghai Institute of Technical Physics (China)
Junwei Lang, Univ. of Chinese Academy of Sciences (China)
Shanghai Institute of Technical Physics (China)
Shengwei Wang, Shanghai Institute of Technical Physics (China)
Xiaoqiong Zhuang, Shanghai Institute of Technical Physics (China)
Feng Zhou, Consultant (China)
Jianyu Wang, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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