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Proceedings Paper

Analysis and modeling on noise factor of microchannel plate
Author(s): Yanhong Li; Xiaomei Chen; Guoqiang Ni
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Paper Abstract

The Microchannel plate (MCP) is the main noise source of low-level light (LLL) image intensifier. Material and the whole manufacturing process of MCP have great impact on the noises of MCP. In this paper, based on the physical mechanisms of MCP, noises of MCP are classified scientifically. By using the data obtained from the actual production and the process test, the regression equation of the noise figure of MCP is derived, and the theoretical model of MCP noise figure is established, including the background noise figure model caused by the dark current of the MCP primarily about the time of the alkali corrosion technic, the ion feedback induced noise figure model caused by the patterns of the MCP channel wall primarily about the time and temperature of the hydrogen reduction technic, and the electronic scattering noise figure model caused by the open area ratio of the MCP primarily about the time of the alkali corrosion technic. Guided by the theoretical model of noise figure, the methods of suppressing noises of MCP are obtained and the technics are optimized. Taking advantage of the new techniques, the noise figure of the third generation MCP has been reduced to below 1.8.

Paper Details

Date Published: 23 December 2013
PDF: 6 pages
Proc. SPIE 9043, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing, 90430Y (23 December 2013); doi: 10.1117/12.2036674
Show Author Affiliations
Yanhong Li, Beijing Institute of Technology (China)
Science and Technology on Low-light-level Night Vision Lab. (China)
North Night Vision Technology Co. Ltd. (China)
Xiaomei Chen, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 9043:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing
Yi Dong; Xiaoyi Bao; Chao Lu; Xiangjun Xin; Xuping Zhang, Editor(s)

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