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Proceedings Paper

Research on the measurement technology and evaluation method of photobiological safety
Author(s): Cai-hong Dai; Zhi-feng Wu; Bin-hua Chen; Yan-fei Wang; Xiang-zhao Li; Lei Fu
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Paper Abstract

Lamps and lamp system are widely used in large quantities in an era. The evaluation and control of optical radiation hazards of lamps and lamp systems is far more complicated. A special measurement and traceability facility was set up at NIM (National Institute of Metrology, China) to evaluate the optical radiation safety of lamp and lamp system, which includes a double grating spectroradiometer OL750D with two different entrance systems of spectral radiance and spectral irradiance traceable to the national primary standard of spectral irradiance by a 1000W spectral irradiance standard lamp, 40W deuterium lamp and a standard diffuser plate. The technical requirements of the measurement instrumentation used for optical radiation safety evaluation including monochromator type, wavelength accuracy, input optics, spectral scan interval and calibration sources are recommended also in this paper. Spectral radiance of a series of LED electric torches and infrared sources were measured by using the new developed system, and potential radiation hazards of retinal blue light hazard and retinal thermal hazard are calculated and evaluated. The optical radiation hazards of some samples are listed in Risk Group 2 (Moderate-Risk).

Paper Details

Date Published: 19 December 2013
PDF: 8 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460W (19 December 2013); doi: 10.1117/12.2036515
Show Author Affiliations
Cai-hong Dai, National Institute of Metrology (China)
Zhi-feng Wu, National Institute of Metrology (China)
Bin-hua Chen, National Institute of Metrology (China)
Beijing Institute of Technology (China)
Yan-fei Wang, National Institute of Metrology (China)
Xiang-zhao Li, Shenzhen Academy of Metrology and Quality Inspection (China)
Lei Fu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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