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Proceedings Paper

Approach to the development of CAD/CAM system for multilayer optical coatings
Author(s): G. R. Mohan Rao; C. L. Nagendra; G. K. M. Thutupalli
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Paper Abstract

CADCAM system is very vital in the development and production of high efficiency optical coatings, in which in-situ analysis and optiniizatfrxi is the nucleus. A new algoritlin for in-situ analysis and optimization of coatings has been proposed, which has provision for precise determination of optical parameters, namely refractive index n, and gearetrical thickness d, of any layer :tt the multilayered configuration and, to account for adverse effect of the deviaticxs in the optical pareters through global re-optimization of the coatings. It has been implemented on 8086/8087 microprocessor systn in which 8086 is a 16 bit microprocessor and 8087, a coprocessor for high speed floating point operatixs. The validity of the algorithn has been established through a wide range of hypothetical case studies and experimental deve1opint of a few coatings such as wideband antireflecticx coatings (ARCs).

Paper Details

Date Published: 1 August 1990
PDF: 12 pages
Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); doi: 10.1117/12.20364
Show Author Affiliations
G. R. Mohan Rao, Andhra Univ. (India)
C. L. Nagendra, ISRO Satellite Ctr. (India)
G. K. M. Thutupalli, ISRO Satellite Ctr. (India)

Published in SPIE Proceedings Vol. 1270:
Optical Thin Films and Applications
Reinhard Herrmann, Editor(s)

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