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Proceedings Paper

Analysis of bit error rate for modified T-APPM under weak atmospheric turbulence channel
Author(s): Zhe Liu; Qi Zhang; Yong-jun Wang; Bo Liu; Li-jia Zhang; Kai-min Wang; Fei Xiao; Chao-gong Deng
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Paper Abstract

T-APPM is combined of TCM (trellis-coded modulation) and APPM (Amplitude-Pulse-position modulation) and has broad application prospects in space optical communication. Set partitioning in standard T-APPM algorithm has the optimal performance in a multi-carrier system, but whether this method has the optimal performance in APPM which is a single-carrier system is unknown. To solve this problem, we first research the atmospheric channel model with weak turbulence; then a modified T-APPM algorithm was proposed, compared to the standard T-APPM algorithm, modified algorithm uses Gray code mapping instead of set partitioning mapping; finally, simulate the two algorithms with Monte-Carlo method. Simulation results showed that, when bit error rate at 10-4, the modified T-APPM algorithm achieved 0.4dB in SNR, effectively improve the system error performance.

Paper Details

Date Published: 23 December 2013
PDF: 7 pages
Proc. SPIE 9043, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing, 90430T (23 December 2013); doi: 10.1117/12.2036245
Show Author Affiliations
Zhe Liu, Beijing Univ. of Posts and Telecommunications (China)
Qi Zhang, Beijing Univ. of Posts and Telecommunications (China)
Yong-jun Wang, Beijing Univ. of Posts and Telecommunications (China)
Bo Liu, Beijing Univ. of Posts and Telecommunications (China)
Li-jia Zhang, Beijing Univ. of Posts and Telecommunications (China)
Kai-min Wang, Beijing Univ. of Posts and Telecommunications (China)
Fei Xiao, Beijing Univ. of Posts and Telecommunications (China)
Chao-gong Deng, Zhangjiakou Vocational and Technical College (China)


Published in SPIE Proceedings Vol. 9043:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing
Yi Dong; Xiaoyi Bao; Chao Lu; Xiangjun Xin; Xuping Zhang, Editor(s)

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