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Proceedings Paper

Phase mask optimization for 3D parallax EDF microscopy
Author(s): Ingeborg E. Beckers; Michael Gierlack; Robert Höppel; Jürgen Landskron
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Paper Abstract

Extended depth-of-field (EDF) microscopy is a well-investigated and very simple method to obtain projection images with an extended depth of focus. Despite its advantages of being a real-time method applicable to any microscopic mode with high lateral resolution that can be simply realized by extending a commercial microscope, the lack of z-correlation is still a problem. In this work we present a combined technique of EDF and stereomicroscopy. By cross-correlation depth information is obtained. Finally, 3D images are reconstructed for best phase masks and simulation results are evaluated experimentally.

Paper Details

Date Published: 12 March 2014
PDF: 7 pages
Proc. SPIE 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 89490Z (12 March 2014); doi: 10.1117/12.2036144
Show Author Affiliations
Ingeborg E. Beckers, Beuth Univ. of Applied Sciences Berlin (Germany)
Michael Gierlack, Beuth Univ. of Applied Sciences Berlin (Germany)
Robert Höppel, Beuth Univ. of Applied Sciences Berlin (Germany)
Jürgen Landskron, Beuth Univ. of Applied Sciences Berlin (Germany)


Published in SPIE Proceedings Vol. 8949:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

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